Nanomaterials Characterization

Nanomaterials Characterization     
Contact: John Passero
1-800-220-3675 ext. 3604
jpassero@EMSL.com

EMSL Analytical, Inc. provides industry and academia with access to the most comprehensive set of services designed to provide the answers needed to understand the complex world of nanomaterials. With multiple laboratories dedicated to pursuing the most modern analysis methods, EMSL provides a wide variety of services needed for both the analysis of individual nanoparticles, as well as for nanoparticles incorporated into composites or devices. These resources also empower EMSL to examine nanoscale devices and semiconductor materials.

Our dedicated materials science laboratory centers span the U.S. with facilities designed for the most challenging projects. Equipped with high-resolution scanning electron microscopes capable of nm scale imaging and analysis, through traditional TEM instrumentation, EMSL provides scalable analysis to support any QA and bulk characterization requirements. For even more complex applications, EMSL offers sub nanometer HR-STEM, FIB-SEM and surface analysis with XPS/AES.

By harnessing the power of these advanced instruments and the expertise that power them, nanomaterials can be characterized by surface, chemical and morphological components. Fully customizable nano-analysis is also available for any project. 

EMSL’s decades of experience means the requirements and services needed by clients working in applications ranging from small independent start-ups, through government agencies and Fortune 500 industrial programs, are just a phone call away. Our industrial hygiene (IH) exposure, device design and nano-crystallography experts are available today to assist with your nanomaterials development applications.