Description |
XRF spectrometry using wavelength-dispersive detectors can be a very good complement to ICP and other spectrophotometric techniques due to its less restrictive sample preparation procedures, wider elemental range (from B(Na) to U), less spectral interferences and more mature theoretical calculation and software in dealing with spectral interferences.
Partial application list:
- Chemical composition: bulk materials, powders, metals, ceramics, glass, coal and coke, liquid.
- Trace elemental analysis: achievable limit of detection (LOD) at parts-per-million level for most elements.
- Petrochemistry: sulfur by standardless method or ASTM D4294/ASTM 2622; lubricant and additives ASTM 4927; Pb in fuels ASTM 5059.
- Metal elements in polymeric materials: RoHS testing.
- Water analysis.
- Mineral analysis: Cu ores; Fe ores; cements, clays.
- Soil and geosciences.
- Sun screen lotion.
- Oxide composition in liquid paint.
- Catalysts.
- Steels: ores, metals, slag, slurries, alloys, special metals, filters, filter cakes.
- Environmental: fluorine in filters; chlorine in water; sewage.
- Food safety: hazardous elements in food.
Instrumentation: Wavelength-dispersive X-ray fluorescence spectrometer with crystals for light element (B, C, N, O) analysis. |